Referenced Items are not available for this document.
This paper presents a test technique that employs two different supply voltages for the same IDDQ pattern. The results of the two measurements are subtracted in order to eliminate the inherent subthreshold leakage. Summary of the experiment carried out on a “System on a Chip” (SOC) device build in 0.35 μm technology is also shown. The experiments proved that the method is effective in detecting failures not detectable with the single limit I DDQ
Published in:
Test Workshop, 2000. Proceedings. IEEE European
Date of Conference: 2000
- Page(s):
- 91 - 96
- Meeting Date :
- 23 May 2000-26 May 2000
- ISSN :
- 1530-1877
- Print ISBN:
- 0-7695-0701-8
- INSPEC Accession Number:
- 6788971
- Conference Location :
- Cascais
- Digital Object Identifier :
- 10.1109/ETW.2000.873784
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
