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LEAP: An accurate defect-free IDDQ estimator

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2 Author(s)
Ferre, A. ; Dept. d''Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain ; Figueras, J.

The quiescent current (IDDQ) consumed by a CMOS IC is a good indicator of the presence of a large class of defects. However, the effectiveness of IDDQ testing requires appropriate discriminability of defective and defect-free currents, and hence it becomes necessary to estimate the currents involved in order to design the IDDQ test. In this work, we present a method to estimate accurately the non-defective IDDQ consumption based on a hierarchical approach at electrical (cell) and logic (circuit) levels. This accurate estimator is used in conjunction with an ATPG to obtain vectors having low/high defect-free IDDQ currents

Published in:

Test Workshop, 2000. Proceedings. IEEE European

Date of Conference:

2000