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Records of the IEEE International Workshop on Memory Technology, Design and Testing

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The following topics were dealt with: failure mechanism and defects; Flash/EEPROM design; new ideas; test and yield; memory testing and built-in-self-test; memory design; and diagnosis

Published in:

High-Performance Distributed Computing, 2000. Proceedings. The Ninth International Symposium on

Date of Conference:

4-4 Aug. 2000