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Using GLFSRs for pseudo-random memory BIST

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4 Author(s)
M. Redeker ; Div. of Design & Test, Lab. for Inf. Technol., Hannover, Germany ; M. Rudack ; T. Lobe ; D. Niggemeyer

We present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory built-in self-test (BIST). Recently, it was shown that using GLFSRs as pattern generators for pseudo-random logic tests can increase the fault coverage noticeably in comparison to standard pseudo-random test pattern generators. Since memory faults differ from logic faults, we examined if that is also the case for pseudo-random memory tests. We found that GLFSRs can increase the fault coverage of pseudo-random tests for several fault types, especially for complex faults as stuck-open faults. Thus, the usage of GLFSRs as pattern generators for pseudo-random memory testing is recommended although some area overhead has to be accepted

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Memory Technology, Design and Testing, 2000. Records of the 2000 IEEE International Workshop on

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