Referenced Items are not available for this document.
For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits
Published in:
Design & Test of Computers, IEEE
(Volume:17
,
Issue:
3
)
Date of Publication: Jul/Sep 2000
- Page(s):
- 106 - 115
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 6699349
- Digital Object Identifier :
- 10.1109/54.867901
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Jul/Sep 2000
- Sponsored by :
- IEEE Council on Electronic Design and Automation
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
