Close category search window
 

Bayesian graph edit distance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Myers, R. ; Praxis Critical Syst. Ltd., Bath, UK ; Wison, R.C. ; Hancock, E.R.

This paper describes a novel framework for comparing and matching corrupted relational graphs. The paper develops the idea of edit-distance originally introduced for graph-matching by Sanfeliu and Fu (1983). We show how the Levenshtein distance (1966) can be used to model the probability distribution for structural errors in the graph-matching problem. This probability distribution is used to locate matches using MAP label updates. We compare the resulting graph-matching algorithm with that recently reported by Wilson and Hancock. The use of edit-distance offers an elegant alternative to the exhaustive compilation of label dictionaries. Moreover, the method is polynomial rather than exponential in its worst-case complexity. We support our approach with an experimental study on synthetic data and illustrate its effectiveness on an uncalibrated stereo correspondence problem. This demonstrates experimentally that the gain in efficiency is not at the expense of quality of match

Published in:
Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:22 ,  Issue: 6 )

Date of Publication: Jun 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.