Cart (Loading....) | Create Account
Close category search window
 

Face recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kohir, V.V. ; Dept. of Electr. Eng., Indian Inst. of Technol., Mumbai, India ; Desai, U.B.

A transform domain face recognition approach is presented. The DCT is coupled with the HMM to achieve a recognition rate of 100% on ORL face database of 40 subjects with 10 images per subject. The recognition time for ORL database is little over 2 Sec. 5 images of a subject are used to train HMM and remaining 5 are used for recognition test. The proposed method is tested on another face data base of 249 subjects with 3 training images and 4 test images per subject. The recognition rate is 90%. A test of recognition is carried out at different resolutions with recognition rate varing from 100% to 95% depending on the resolution. Further, a simple scheme is proposed to incorporate rejection of images of new subjects. On ORL database 100% rejection occurs for the images of new subjects

Published in:

Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on  (Volume:5 )

Date of Conference:

2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.