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P1450.1: STIL for the simulation environment

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2 Author(s)
Wohl, P. ; Synopsys Inc., Williston, VT, USA ; Biggs, N.

The Standard Test Interface Language (STIL IEEE-1450) was developed to transport patterns from the generation environment to testers. STIL was also shown to support test-generation input constructs. This paper analyzes the requirements of the simulation environment and presents extensions to STIL (IEEE-P1450.1) to support all aspects of test-pattern generation and simulation

Published in:

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Date of Conference:

2000