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Linear independence as evaluation criterion for two-dimensional test pattern generators

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3 Author(s)
Mrugalski, G. ; Poznan Tech. Univ., Poland ; Tyszer, J. ; Rajski, J.

The probability of obtaining desired test patterns in subsequences generated by two-dimensional test pattern generators is examined. Various architectures of generators comprising of linear feedback shift registers, cellular automata and associated phase shifters are thoroughly investigated. Two new algorithms that can be employed to synthesize phase shifters minimizing linear dependencies and assuring highly balanced usage of all generator stages are also introduced

Published in:

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Date of Conference:

2000

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