Cart (Loading....) | Create Account
Close category search window
 

FXR fast beam imaging diagnostics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Ong, M. ; Lawrence Livermore Nat. Lab., CA, USA ; Ferriera, T. ; Gilliam, R. ; Zentler, J.
more authors

The Lawrence Livermore National Laboratory flash X-ray (FXR) machine is being upgraded to produce two pulses. A very fast imaging system has been developed to characterize the electron beam diameter and shape. The system consists of a kapton target insertion mechanism and a framing camera. It has a fast gated imaging tube (500 ps) and CCD subsystem to capture and send the image to the control room. The beam diameter data provides insight on mechanisms that effect the X-ray spot size. These colorful beam measurements are compared with the authors' other diagnostics to form a more complete picture of beam behavior. A demonstration is described where the image data was used to design a collimator to improve X-ray beam performance.

Published in:

Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International  (Volume:2 )

Date of Conference:

27-30 June 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.