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Aperture jitter effects in wideband ADC systems

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4 Author(s)
H. Kobayashi ; Dept. of Electron. Eng., Gunma Univ., Japan ; M. Morimura ; K. Kobayashi ; Y. Onaya

This paper describes the exact formula of the output noise power for almost any input signal in wideband sampling systems in the presence of aperture jitter. Also the finite aperture time effects and the timing skew problem in the interleaved ADC system are discussed. These results are useful for wideband sampling system applications

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Electronics, Circuits and Systems, 1999. Proceedings of ICECS '99. The 6th IEEE International Conference on  (Volume:3 )

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