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Built-in self-test in mixed-signal ICs: a DTMF macrocell

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4 Author(s)
Huertas, G. ; Inst. de Microelectron., Seville Univ., Spain ; Vazquez, D. ; Rueda, A. ; Huertas, J.L.

This paper describes a Design-for-Test (DfT) approach to implement a DTMF embeddable macrocell. The goal is to prove the feasibility of a Built-In-Self-Test (BIST) methodology to mixed-signal ICs. Results from a silicon demonstrator are presented

Published in:

VLSI Design, 2000. Thirteenth International Conference on

Date of Conference:

2000