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Built-in self-test in mixed-signal ICs: a DTMF macrocell

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4 Author(s)
G. Huertas ; Inst. de Microelectron., Seville Univ., Spain ; D. Vazquez ; A. Rueda ; J. L. Huertas

This paper describes a Design-for-Test (DfT) approach to implement a DTMF embeddable macrocell. The goal is to prove the feasibility of a Built-In-Self-Test (BIST) methodology to mixed-signal ICs. Results from a silicon demonstrator are presented

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VLSI Design, 2000. Thirteenth International Conference on

Date of Conference: