Referenced Items are not available for this document.
This paper describes a technique for measurement of high frequency current distributions in microprocessors and other VLSI devices. The technique uses optical precision stepper motors for highly accurate placement of electric and magnetic field probes. Spatial resolution across a device is on the order of 100-200 micrometers. Typical scans accumulate 10000 data points across a scan area of approximately 35 mm 2. Characterizing a device involves a repeated series of spatial scans at harmonics of the fundamental clock frequency
Published in:
Electromagnetic Compatibility, 1999 IEEE International Symposium on
(Volume:2
)
Date of Conference: 1999
- Page(s):
- 887 - 892 vol.2
- Meeting Date :
- 02 Aug 1999-06 Aug 1999
- Print ISBN:
- 0-7803-5057-X
- INSPEC Accession Number:
- 6558769
- Conference Location :
- Seattle, WA
- Digital Object Identifier :
- 10.1109/ISEMC.1999.810172
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
