By Topic

Incorporating statistical process control into the team-based TPM environment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Conway, T. ; Cypress Semicond., Bloomington, MN, USA ; Perry, E.

Total Productive Manufacturing (TPM) and Statistical Process Control (SPC) have similar objectives in that both strive to maintain optimal performance of processes and equipment. The effectiveness of both is also enhanced through the involvement of operators in cross-functional teams. Cypress Semiconductor is successfully integrating SPC into its TPM structure

Published in:

Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on

Date of Conference: