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On detecting bridges causing timing failures

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3 Author(s)
S. Mandava ; Microprocessor Products Group, Intel Corp., Santa Clara, CA, USA ; S. Chakravarty ; S. Kundu

High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at detecting such defects. The following results, pertinent to resolving the above issue, are presented: mechanisms by which bridges cause speed failure; identification of non-classical transition tests for such bridges; and the usefulness and pitfalls of using low voltage testing to detect such bridges

Published in:

Computer Design, 1999. (ICCD '99) International Conference on

Date of Conference: