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On-line BIST for testing analog circuits

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3 Author(s)
Velasco-Medina, J. ; Reliable Integrated Syst. Group, TIMA/INPG, Grenoble, France ; Rayane, I. ; Nicolaidis, M.

In this paper, we present a new online built-in self-test (BIST) approach for testing analog circuits. It uses a current window comparator and current-based checker circuits for processing the test response of the analog parts in mixed-signal integrated circuits. Online analog BIST capability is achieved by using high-speed current-mode circuits. A leapfrog filter has been considered as a test vehicle, and simulation results show the feasibility and effectiveness of the proposed BIST approach

Published in:

Computer Design, 1999. (ICCD '99) International Conference on

Date of Conference:

1999