Referenced Items are not available for this document.
In this paper, an efficient built-in self-test (BIST) method for applying tests is developed without collisions of the test data in three-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and a BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility
Published in:
Computer Design, 1999. (ICCD '99) International Conference on
Date of Conference: 1999
- Page(s):
- 328 - 329
- Meeting Date :
- 10 Oct 1999-13 Oct 1999
- ISSN :
- 1063-6404
- Print ISBN:
- 0-7695-0406-X
- INSPEC Accession Number:
- 6416543
- Conference Location :
- Austin, TX
- Digital Object Identifier :
- 10.1109/ICCD.1999.808562
- Product Type:
- Conference Publications
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