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Multiple paths sensitization of digital oscillation built-in self test

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1 Author(s)
Dufaza, C. ; Lab. d''Inf., de Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

Digital oscillation built-in self test (DOBIST) deals with testing path delay, gate delay and stuck-at faults in digital integrated circuits. This test methodology consists of sensitizing paths in the circuit under test so that they can oscillate as ring oscillators. While the 1st version of DOBIST is limited to single path sensitization equations reported in this paper allow concurrent multiple paths sensitization. It results a simplification of the test generation procedure and a significant decrease of the test time

Published in:

Computer Design, 1999. (ICCD '99) International Conference on

Date of Conference:

1999