Multiple paths sensitization of digital oscillation built-in self test

Digital oscillation built-in self test (DOBIST) deals with testing path delay, gate delay and stuck-at faults in digital integrated circuits. This test methodology consists of sensitizing paths in the circuit under test so that they can oscillate as ring oscillators. While the 1/sup st/ version of DOBIST is limited to single path sensitization equations reported in this paper allow concurrent multiple paths sensitization. It results a simplification of the test generation procedure and a significant decrease of the test time.