Referenced Items are not available for this document.
This I/O driver supports 3.3/2.5/1.8-V interfaces in a 3.5-nm Tox, 1.8-V CMOS technology. A bias generator, its switch capacitors, and a level shifter with protection network guarantee reliability and improve noise rejection. Measured output timing degradation is 2.5 ps per I/O switching. Buried resistors limit variation in output impedance. Interface delay of 2 ns with worst case I/O switching allows 400-MHz operation
Published in:
Solid-State Circuits, IEEE Journal of
(Volume:34
,
Issue:
11
)
Date of Publication: Nov 1999
- Page(s):
- 1501 - 1511
- ISSN :
- 0018-9200
- INSPEC Accession Number:
- 6418527
- Digital Object Identifier :
- 10.1109/4.799854
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Nov 1999
- Sponsored by :
- IEEE Solid-State Circuits Society
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