By Topic

Techniques for analyzing cycle time variability in fab and probe

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Sattler, L. ; Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland ; O'Connor, S. ; Hallinan, M. ; Finucane, T.

Reducing cycle time variability between fab and probe requires first an assessment of where the problems lie. Potential solutions may create new problems. In this paper we show techniques-metrics and statistics-that were used at Analog Devices in a systematic fashion to isolate the biggest areas for improvement and increase lead time reliability

Published in:

Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI

Date of Conference: