By Topic

A new approach for fast line detection based on combinatorial optimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mattavelli, M. ; Integrated Syst. Center, Swiss Federal Inst. of Technol., Lausanne, Switzerland ; Noel, V. ; Amaldi, E.

In this paper we present a new algorithm for detecting lines in digital images. The algorithm is based on a general combinatorial optimization approach for estimating piecewise linear models that we introduced previously (Mattavelli et al., 1997). A linear system is constructed with the coordinates of all contour points in the image as coefficients and the line parameters as unknowns. The resulting linear system is then partitioned into a close-to-minimum number of consistent subsystems using a greedy strategy based on a thermal variant of the perceptron algorithm. While the partition into consistent subsystems yields the classification of the corresponding image points into a close-to-minimum number of lines, the solution of each subsystem provides the parameters of those lines. An extensive comparison with the standard Hough transform and the randomized Hough transform shows the considerable advantages of our combinatorial optimization approach in terms of memory requirements, time complexity, robustness with respect to noise, and quality of the solution regardless of the parameter settings

Published in:

Image Analysis and Processing, 1999. Proceedings. International Conference on

Date of Conference: