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This paper explores an alternative approach to automated test generation based on Al technology: planner based test generation. In planner based test generation, test cases are generated from a domain theory (model of the system being tested), and a description of the initial and desired (goal) state(s) of the system. We identify three key issues and trade-offs in the process of developing a planner based automated test case generator: how to extract knowledge about the domain (domain analysis), how to represent the knowledge (paragmatics of domain representation in the planner) and how to decompose the generation process to exploit the planner's capabilities. We illustrate what we have learned with examples and evaluation of the resulting test cases and the process of generating them
Published in:
Aerospace Conference, 1999. Proceedings. 1999 IEEE
(Volume:5
)
Date of Conference: 1999
- Page(s):
- 83 - 92 vol.5
- Meeting Date :
- 06 Mar 1999-13 Mar 1999
- Print ISBN:
- 0-7803-5425-7
- INSPEC Accession Number:
- 6504945
- Conference Location :
- Snowmass at Aspen, CO
- Digital Object Identifier :
- 10.1109/AERO.1999.790192
- Product Type:
- Conference Publications
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