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VLSI design and test sequence in an academic environment: a case study

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3 Author(s)
Nowakowski, P. ; Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA ; Dziurla-Rucinska, B. ; Rucinski, A.

Testing is an integral part of IC development process and its importance is steadily increasing. At the same time there exists a shortage of test engineers in the marketplace. The authors observe a considerable unbalance in the electrical engineering curricula between an abundance of courses offered in VLSI design/semiconductor materials and in testing. One of the root causes is due to the cost of the course related test equipment. This paper presents an educational experience implemented at the University of New Hampshire which incorporates both the design and testing aspects in VLSI which has been facilitated by the generous support and involvement of the regional industry. Additional byproducts of the course sequence are ambitious real life projects conducted by the students

Published in:

Microelectronic Systems Education, 1999. MSE'99. IEEE International Conference on

Date of Conference:

1999

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