Referenced Items are not available for this document.
This article explains the major IC reliability failure mechanisms with perspectives on their severity and relation to test.
Published in:
Design & Test of Computers, IEEE
(Volume:16
,
Issue:
3
)
Date of Publication: July-Sept. 1999
- Page(s):
- 64 - 71
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 6354814
- Digital Object Identifier :
- 10.1109/54.785836
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- July-Sept. 1999
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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