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A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set

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3 Author(s)
L. Escotte ; LAAS, Univ. Paul Sabatier, Toulouse, France ; J. -G. Tartarin ; J. Graffeuil

The operating frequency range of an on-wafer noise parameter test set based on the multiple-impedance technique has been extended in the low-microwave frequency range (down to the L-band). A simple technique, using a phase shifter cascaded with the microwave tuner, allows different reflection coefficients of the load impedance to be obtained at the device input. These coefficients are well distributed over the Smith chart in the entire frequency range. As an example, noise parameters of a passive device have been measured between 1 and 8 GHz, and a good agreement between measured and calculated values is observed. This technique has also been used to measure the noise parameters of different heterojunction bipolar transistors. A minimum noise figure of 1 dB was obtained at 1 GHz on a GaAlAs/GaAs HBT which is in agreement with expected results

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:48 ,  Issue: 4 )