By Topic

Oscillation-test methodology for low-cost testing of active analog filters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Arabi, K. ; Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada ; Kaminska, B.

The oscillation-test strategy is a low cost and robust test method for mixed-signal integrated circuits. Being a vectorless test method, it allows one to eliminate the analog test vector generator. Furthermore, as the oscillation frequency is considered to be digital, it can be precisely analyzed using pure digital circuitry and can be easily interfaced to test techniques dedicated to the digital part of the circuit under test (CUT). This paper describes the design for testability (DFT) of active analog filters based on oscillation-test methodology. Active filters are transformed to oscillators using very simple techniques. The tolerance band of the oscillation frequency is determined by a Monte Carlo analysis taking into account the nominal tolerance of all circuit under test components. Discrete practical realizations and extensive simulations based on CMOS 1.2 μm technology parameters affirm that the test technique presented for active analog filters ensures high fault coverage and requires a negligible area overhead. Finally, the DFT techniques investigated are very suitable for automatic testable filter synthesis and can be easily integrated in the tools dedicated to automatic filter design

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:48 ,  Issue: 4 )