By Topic

ANAMET comparison of complex scattering coefficient measurements of microwave adaptors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
N. M. Ridler ; Centre for Electromagn. Metrol., Nat. Phys. Lab., Teddington, UK

This paper presents results obtained from a recent exercise to compare measurements of the complex scattering coefficients of electrical adaptors at microwave frequencies. The results obtained by the six laboratories participating in the exercise are summarised in terms of the between laboratory reproducibility. Multivariate robust statistical techniques are used to obtain summary statistics for the complex-valued data. The comparison exercise was coordinated by ANAMET-the Automatic Network Analyser METrology forum for people and organisations involved in RF and microwave network measurements

Published in:

Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE  (Volume:3 )

Date of Conference: