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Automated characterization of ceramic multilayer capacitors

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5 Author(s)
Benabe, E. ; Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA ; Skowronski, K. ; Weller, T. ; Gordon, H.
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This paper describes an automated test configuration that is used for rapid characterization of the equivalent series resistance (ESR) of ceramic multilayer capacitors. The primary components in this system are a coaxial resonant line, an HP 8753D vector network analyzer, and a personal computer. Sample measurements are provided for several 1206 style capacitors, and the trends in ESR versus the internal capacitor architecture are presented.

Published in:

ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd

Date of Conference:

3-4 Dec. 1998