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This work facilitates the testing of datapath-controller pairs in an integrated fashion, with datapath and controller tested together in a single test session. Such an approach requires less test overhead than an approach that isolates datapath and controller from each other during test. The ability to do an integrated test is especially important when testing core-based embedded systems. The key to the approach is a careful examination of the relationship between techniques for controller synthesis and the types of gate level controller faults that can occur. A method for controller synthesis is outlined that results in a fully testable controller, so that full fault coverage of the controller can be achieved without any need for isolation during test.
Date of Conference: 9-12 March 1999