Close category search window
 

Improved blotch detection by postprocessing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Biemond, J. ; Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands ; van Roosmalen, P.M.B. ; Lagendijk, R.L.

Blotches are common artifacts in old film sequences that manifest themselves as disturbing bright or dark spots. Existing methods for detecting blotches can achieve high detection rates. High detection rates are only useful if the corresponding number of false alarms is not too high, visible artifacts in the corrected sequence result otherwise. We show that the performance of blotch detectors can be improved significantly by taking statistical influence of noise on the detection mechanism into account. Further improvements are achieved first by using a double-stage detection strategy and second by a constrained dilation technique

Published in:
Acoustics, Speech, and Signal Processing, 1999. Proceedings., 1999 IEEE International Conference on  (Volume:6 )

Date of Conference: 15-19 Mar 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.