Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. For technical support, please contact us at onlinesupport@ieee.org. We apologize for any inconvenience.
By Topic

DARSI: RC data reduction [VLSI simulation]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Vanoostende, P. ; IMEC, Leuven, Belgium ; Six, P. ; de Man, H.J.

Taking into account RC effects in VLSI simulation and verification systems, without seriously degrading their efficiency, requires preliminary data reduction. A tool, DARSI (data reduction system for interconnects), that can handle both polysilicon and diffusion resistive effects is presented. It contains the reduction scheme described by S.-L. Su et al. (Proc. IEEE Conf. Computer-Aided Design, p.270-3, 1986), a novel line-based reduction method, a novel loop reduction scheme, and a technique for identifying important diffusion resistors. The number of parasitic elements is considerably reduced, while guaranteeing delay errors to be less than a few percent. DARSI is implemented in a general-purpose rule-based verification environment for VLSI and has a nearly linear complexity. Application to several practical designs is also discussed

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:10 ,  Issue: 4 )