By Topic

Fuzzy-based CMOS circuit partitioning in built-in current testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wang-Dauh Tseng ; Dept. of Comput. & Inf. Sci., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Kuochen Wang

We propose a fuzzy-based approach which provides a soft threshold to determine the module size for CMOS circuit partitioning in built-in current testing (BICT). Experimental results show that our design approach indeed provides a feasible way to exploit the design space of BICT partitioning in comparison with other approaches with a fixed threshold, and a better module size can thus be determined to reflect a change of circuit properties.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:7 ,  Issue: 1 )