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Test sequencing problems arising in test planning and design for testability

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3 Author(s)
Raghavan, V. ; Mathworks Inc., Natick, MA, USA ; Shakeri, M. ; Pattipati, K.R.

We consider four test sequencing problems that frequently arise in test planning and design for testability (DFT) processes. Specifically, we consider the following problems: (1) how to determine a test sequence that does not depend on the failure probability distribution; (2) how to determine a test sequence that minimizes expected testing cost while not exceeding a given testing time; (3) how to determine a test sequence that does not utilize more than a given number of tests, while minimizing the average ambiguity group size; and (4) how to determine a test sequence that minimizes the storage cost of tests in the diagnostic strategy. We present various solution approaches to solve the above problems and illustrate the usefulness of the proposed algorithms

Published in:

Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on  (Volume:29 ,  Issue: 2 )