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Possibilities and limitations of IDDQ testing in submicron CMOS

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2 Author(s)
Figueras, J. ; Electron. Eng. Dept., Polytech. Univ. of Catalonia, Barcelona, Spain ; Ferre, A.

IDDQ testing is a well accepted testing approach based on the observation of the quiescent current consumption. Its growing industrial implementation is based on the possibility of detecting defects which escape other more traditional testing methods. However, its application costs are higher and its effectiveness in deep submicron technologies may decrease if the current trend of leakage increase is not stopped by creative innovation

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Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on  (Volume:21 ,  Issue: 4 )