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Basic study on the application of parametric spline functions to the holographic pattern measuring system

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3 Author(s)
M. Taniguchi ; Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan ; T. Tsuchiya ; T. Takagi

The authors have developed a holographic pattern measuring system (HPMS) for quantitative measurement of microscopic displacement and mechanical vibration with high precision. In this study, a parametric spline function (PSF) was applied to the HPMS in order to obtain highly accurate smooth curves for fringe patterns from these holographic interferograms. The relation between the number of sampled points and the error rate was also investigated, and some experiments were conducted

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:47 ,  Issue: 1 )