Cart (Loading....) | Create Account
Close category search window
 

Compact emittance scanners for MeV particle beams

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
O'Shea, P.G. ; Los Alamos Nat. Lab., NM, USA ; Zaugg, T.J. ; Hansborough, L.D.

Compact electric sweep emittance scanners have been developed to operate in the mega-electronvolt range. These scanners are suitable for the analysis of electron and ion beams. The scanners have excellent angular resolution despite their compact dimensions. Electrical and mechanical design and scaling parameters are presented. Operational experience with a 1 MeV, 25 mA, 50 μs H- beam is discussed

Published in:

Particle Accelerator Conference, 1989. Accelerator Science and Technology., Proceedings of the 1989 IEEE

Date of Conference:

20-23 Mar 1989

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.