Referenced Items are not available for this document.
Quality checking and part measurement are well established procedures in manufacturing processes. There are requirements for complete part inspections e.g. in the manufacturing process of SMD devices. To check coplanarity of pins on all chip sides is such a requirement. The paper refers a solution allowing to perform the contactless inspection task for all four chip sides from one point of view. The required accuracy is reached by a special subpixel approach. For a test set, the comparison to a proved dial flow-meter has shown the high accuracy of the developed system
Published in:
Industrial Electronics Society, 1998. IECON '98. Proceedings of the 24th Annual Conference of the IEEE
(Volume:4
)
Date of Conference: 31 Aug-4 Sep 1998
- Page(s):
- 2425 - 2427 vol.4
- Meeting Date :
- 31 Aug 1998-04 Sep 1998
- Print ISBN:
- 0-7803-4503-7
- INSPEC Accession Number:
- 6135684
- Conference Location :
- Aachen
- Digital Object Identifier :
- 10.1109/IECON.1998.724105
- Product Type:
- Conference Publications
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