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A new testing method of an enameled wire with a developed nanosecond pulse generator

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1 Author(s)
Kando, Masaaki ; Tokai Univ., Kanagawa, Japan

This paper describes a newly developed nanosecond pulse generator in order to make tests for degradation in dielectrics, fault detection, breakdown voltage in gases, so on, and result of breakdown voltage on an enameled wire under a proposed testing method

Published in:

Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on

Date of Conference:

22-25 Jun 1998