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Measuring transistor dynamic loadlines and breakdown currents under large-signal high-frequency operating conditions

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4 Author(s)
Verspecht, J. ; Hewlett-Packard NMDG, Brussels, Belgium ; Schreurs, D. ; Verspecbt, J. ; Schreurs, D.

The "Nonlinear Network Measurement System" accurately measures dynamic loadlines and breakdown currents of microwave transistors under high-frequency large-signal operating conditions. This measurement capability allows the designer to find optimal operating conditions for a given device without the need for large-signal models. Measuring RF breakdown currents allows the designer to tackle reliability issues in a way not possible before.

Published in:

Microwave Symposium Digest, 1998 IEEE MTT-S International  (Volume:3 )

Date of Conference:

7-12 June 1998