W-band on-wafer load-pull measurement system and its application to HEMT characterization

An on-wafer large-signal characterization system has been developed for W-band frequency applications. The system is computer-controlled and employs a high-precision electromechanical W-band tuner. Its application to obtaining constant output power and gain contours as well as power saturation characteristics of submicron InP-based HEMTs is demonstrated at 77 GHz and 102 GHz.