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Applications of on-chip samplers for test and measurement of integrated circuits

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6 Author(s)
Ron Ho ; Stanford Univ., CA, USA ; Amrutur, B. ; Ken Mai ; Wilburn, B.
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Displaying the real-time behavior of critical signals on VLSI chips is difficult and can require expensive test equipment. We present a simple sampling technique to display the analog waveforms of high bandwidth on-chip signals on a laboratory oscilloscope. It is based on the subsampling of periodic signals. This circuit was used to verify the operation of a recent low-power SRAM design.

Published in:

VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on

Date of Conference:

11-13 June 1998