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2 Author(s)
Marimuthu, P. ; Indian Telephone Industries Ltd., Bangalore, India ; Raghunatharr, K.S.

This paper describes a tool thuturiiomatically geizeru tes ATE compatible test program from CAD data for ASIC prototype evaluation. It crlso assists iri creating wire bond data required to assemble MICs in i-arious types ofpacliaps. This tool helps it1 achieving fast turn around time to generate ASIC test program for target ATE.

Published in:

VLSI Design, 1993. Proceedings. The Sixth International Conference on

Date of Conference:

3-6 Jan. 1993