Cart (Loading....) | Create Account
Close category search window

A FIFO data switch design experiment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Coates, W.S. ; Sun Microsyst. Labs., Palo Alto, CA, USA ; Lexau, J.K. ; Jones, I.W. ; Fairbanks, S.M.
more authors

A core problem in many pipelined circuit designs is data-dependent data flow. We describe a methodology and a set of circuit modules to address this problem in the asynchronous domain. We call our methodology P**3, or “P cubed”. Items flowing through a set of FIFO datapaths can be conditionally steered under the control of data carried by other FIFOs. We have used the P**3 methodology to design and implement a FIFO rest chip that uses a data-dependent switch to delete marked data items conditionally. The circuit uses two on-chip FIFO rings as high-speed data sources. It was fabricated through MOSIS using their 0.6 μ CMOS design rules. The peak data switch throughput was measured to be a minimum of 580 million data items per second at nominal Vdd of 3.3 V

Published in:

Advanced Research in Asynchronous Circuits and Systems, 1998. Proceedings. 1998 Fourth International Symposium on

Date of Conference:

30 Mar-2 Apr 1998

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.