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Parametric yield optimization of electronic circuits via improved centers of gravity algorithm

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2 Author(s)
Kermat, M. ; Service des Mesures, Ecole Superieure d''Electr., Gif-sur-Yvette, France ; Kielbasa, R.

An improved centers of gravity (CG) algorithm is presented for circuit yield optimization or for the well-known design centering (DC) problem. The CG algorithm is based on the estimation of circuit yield and CG of pass and fail sampled points. A new type of estimator and the Latin hypercube sampling (LHS) scheme are proposed in order to improve the estimation accuracy with the same computational time. Simulation results have shown a good agreement with the theoretical basis.

Published in:

Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on  (Volume:2 )

Date of Conference:

3-6 Aug. 1997