Referenced Items are not available for this document.
A superconducting sampler system with a self-triggering mechanism achieved a 70-GHz bandwidth, 5-ps rise time resolution, 20-μV r.m.s. (root mean square) noise floor, less than 1-ps jitter, and an 8-mV, 70-GHz triggering capability. The sampler was used for studying ion-induced SEU (single-event-upset) transient phenomena in silicon diodes and GaAs MESFETs. Compared with conventional methods, the superconducting sampling system is easy to use and provides superior capabilities. An SEU transient has been measured with a record 25-ps rise time. The superconducting sampler configured as a TDR (time-domain reflectometer) has achieved a 2.5-ps rise time at the I/O interface after deconvolution. This corresponds to a 0.375-mm spatial resolution. It is concluded that the TDR can provide useful information for improving the performance of microwave and millimeter-wave devices
Published in:
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Date of Conference: 13-15 Feb 1990
- Page(s):
- 255 - 258
- Meeting Date :
- 13 Feb 1990-15 Feb 1990
- INSPEC Accession Number:
- 3719734
- Conference Location :
- San Jose, CA
- Digital Object Identifier :
- 10.1109/IMTC.1990.66012
- Product Type:
- Conference Publications
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