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Bridging the gap between design and testing of analog integrated circuits

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5 Author(s)
E. Soenen ; Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA ; P. VanPeteghem ; H. Liu ; S. Narayan
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It is noted that an important problem associated with analog and mixed analog/digital VLSI design has been the lack of a systematic approach to the design and testing of such integrated systems. The authors describe a computer environment that brings the different design aspects closely together. It has been used successfully to analyze the performance of high-speed flash analog/digital converters. Interaction among simulations, CAD (computer-aided design) tools, measurements, and testing is provided for in this approach

Published in:

Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE

Date of Conference:

13-15 Feb 1990