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A fully digital controlled off-chip IDDQ measurement unit

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4 Author(s)
Straka, B. ; CEDO, Brno, Czech Republic ; Manhaeve, H. ; Vanneuville, J. ; Svajda, M.

The paper describes a new Digital controlled Off-Chip IDDQ Measurement Unit (DOCIMU), which provides reliable precision and relatively fast measurements, even with a high capacitive load, while the Device Under Test (DUT) is unaffected. The maximal resolution is 50 nA and the accurate measurement range is 1 mA. Unlike other IDDQ monitors, the DOCIMU copes with external interference, as it needs no analogue pin to set the IDDQ limit and the noise at the VDD is eliminated via a special S/H feature. The DOCIMU is also a testable IDDQ monitor, which is another unique feature

Published in:

Design, Automation and Test in Europe, 1998., Proceedings

Date of Conference:

23-26 Feb 1998