Referenced Items are not available for this document.
The paper describes a new Digital controlled Off-Chip IDDQ Measurement Unit (DOCIMU), which provides reliable precision and relatively fast measurements, even with a high capacitive load, while the Device Under Test (DUT) is unaffected. The maximal resolution is 50 nA and the accurate measurement range is 1 mA. Unlike other IDDQ monitors, the DOCIMU copes with external interference, as it needs no analogue pin to set the IDDQ limit and the noise at the VDD is eliminated via a special S/H feature. The DOCIMU is also a testable IDDQ monitor, which is another unique feature
Published in:
Design, Automation and Test in Europe, 1998., Proceedings
Date of Conference: 23-26 Feb 1998
- Page(s):
- 495 - 500
- Meeting Date :
- 23 Feb 1998-26 Feb 1998
- Print ISBN:
- 0-8186-8359-7
- INSPEC Accession Number:
- 5906845
- Conference Location :
- Paris
- Digital Object Identifier :
- 10.1109/DATE.1998.655904
- Product Type:
- Conference Publications
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