By Topic

Burn-in tests for reliability assurance of semiconductor devices used in life qualified equipment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
L. Galateanu ; Nat. Inst. Inst. for Microtechnol., Bucharest, Romania ; F. Baicu ; D. Boboc

A design method of the burn-in tests which assure the fulfilment by the aged semiconductor devices of the reliability specifications required for using in life qualified equipment is introduced. The different acceleration by temperature for different failure mechanism populations is taken into account. A solution for successive picking out of the ageing test conditions, for the iterative finding of the optimum situation, is given

Published in:

Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International  (Volume:2 )

Date of Conference:

7-11 Oct 1997