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Burn-in tests for reliability assurance of semiconductor devices used in life qualified equipment

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3 Author(s)
Galateanu, L. ; Nat. Inst. Inst. for Microtechnol., Bucharest, Romania ; Baicu, F. ; Boboc, D.

A design method of the burn-in tests which assure the fulfilment by the aged semiconductor devices of the reliability specifications required for using in life qualified equipment is introduced. The different acceleration by temperature for different failure mechanism populations is taken into account. A solution for successive picking out of the ageing test conditions, for the iterative finding of the optimum situation, is given

Published in:

Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International  (Volume:2 )

Date of Conference:

7-11 Oct 1997