Cart (Loading....) | Create Account
Close category search window
 

ESD field penetration through slots into shielded enclosures: a time domain approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Cerri, G. ; Dipt. di Elettronica e Autom., Ancona Univ., Italy ; De Leo, R. ; de Rentiis, R. ; Primiani, Valter Mariani

This paper presents a time domain approach for the analysis of the coupling between an electrostatic discharge (ESD) current and the internal region of a shielded enclosure with a slot. The application of the equivalence principle allows us to obtain an integro-differential equation for the unknown distribution of the aperture electric field. The numerical solution is obtained by an iterative procedure developed by the method of moments (MoM) in the time domain. The approach is also applied at the case of a transient incident field of a plane wave impinging on the enclosure. The use of proper impulse responses for the space and cavity regions make the model efficient from a computational point of view, without loss in accuracy. Theoretical results are validated by measurements

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:39 ,  Issue: 4 )

Date of Publication:

Nov 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.