By Topic

Dynamic Analysis of Current-Voltage Characteristics of Nanoscale Gated-Thyristors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Paolucci, G.M. ; Dipt. di Elettron., Inf. e Bioingegneria, Inf. e Bioingegneria, Milan, Italy ; Compagnoni, C.M. ; Castellani, N. ; Carnevale, G.
more authors

This letter presents a detailed experimental investigation of the current-voltage characteristics of deca-nanometer gated-thyristors, highlighting that strong differences exist between the static and the dynamic operation of these devices. In particular, results reveal that the forward-breakover voltage determining thyristor turn-on does not depend only on the applied gate voltage, but also on the rise time of the applied gate pulse, decreasing for fast pulse fronts. This is explained in terms of a higher electron injection from the cathode to the anode triggering device turn-on when the gate switching time is shorter than that required for holes to leave the p-base.

Published in:

Electron Device Letters, IEEE  (Volume:34 ,  Issue: 5 )